Testing Vlsi Circuit Using Artificial Immune System
نویسندگان
چکیده
A VLSI circuit test scheme taking inspiration from the Human Immune System is presented. Such a scheme is based on the Negative-Selection Mechanism which provides the human body with the capability to discriminate between the self (body’s own cell) and any foreign cell (non-self). Based on this, it is design a output response analyzer which is able to evaluate is the circuit is faulty. Experimental results showing the effectively of the proposed scheme are presented.
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